Francis Anto Akkara

Intern in Hardware eAMS -electronics Analysis Modeling & Simulation • Simulation of a Conducted Emission measurement according to CISPR 25 6.2. • Transfer the test method from CISPR 25 6.2 into a simulation environment. • Support in performing the Conducted Emission test according to CISPR 25 6.2 in the Electromagnetic Compatibility laboratory. • Research on developing a simulation environment according to CISPR 25 6.2 before building prototype for testing.

• DRAM Testing • Retention time test and Row hammer test for Micron, ISSI, and Nanya DDR3 SDRAM at 25˚C, 55˚C and 85˚C using HILEVEL Griffin III Test Tool. • Development of Automated test for advanced and state of the art systems. • Development of respective test set up program file for Row hammer test in LABVIEW. • Analyzing Row hammer effects in DDR3 SDRAM.

Electromagnetic compatibility, Microelectronics and Electrodynamics. Master project: Design, Modeling and Experimentation of Aperture Antennas Projects for Electromagnetic Compatibility. Other Project: PCB Design and Test for Radiated Emission Measurement.

Electric circuits & networks, Electromagnetic fields and Electric drives & control.